The semiconductor industry thrives on nanometer-level precision, making Metrology indispensable. The smallest measurement error in wafer production can lead to defective chips, impacting entire batches and increasing costs.
Semiconductor metrology involves advanced techniques like scanning electron microscopy (SEM), atomic force microscopy (AFM), and optical scatterometry. These allow manufacturers to measure critical dimensions (CD) and ensure consistent feature sizes on microchips.
As chip architectures shrink, the margin for error decreases dramatically. Metrology enables process control in photolithography, etching, and deposition — stages where precision is paramount. Real-time feedback loops help adjust processes instantly, maintaining yield rates.
With the rapid advancement of AI, 5G, and IoT devices, semiconductor demand is skyrocketing. The industry’s ability to meet this demand hinges on robust metrology systems that guarantee every chip meets stringent performance requirements.
